With the rapid development of smart vehicles and autonomous driving technologies, ensuring safety,
security, and reliability from the underlying chips to entire vehicle systems has become a central
focus for the industry. RTRC is honored to serve as a co-organizer for the "2026 SGS TREND SEMINAR,"
hosted by the SGS Functional Safety and Cybersecurity Center, to jointly advance the development of
automotive standards.
Themed "SAFETY, SECURITY, RELIABILITY - THE CORE OF SMART MOBILITY," this seminar advocates a
comprehensive protection approach "From Chip to System," bringing together experts and scholars to
shape the future of automotive standards.
The seminar will delve into five key topics (Key Discussions & Insights):
．Future of Compliance
．AI & Autonomous Driving
．Semiconductor Excellence
．Development Tools
．Industry Perspectives
NTU RTRC has long been dedicated to research on the reliability and radiation-hardening technologies
of space and automotive electronic components. This aligns perfectly with the seminar's emphasis on
"Semiconductor Excellence" and system reliability. We sincerely invite professionals from industry,
academia, and research institutes who are interested in automotive electronics, smart mobility,
functional safety, and cybersecurity to register and join us in exploring the latest industry
trends!
[Event Information]
Event: 2026 SGS TREND SEMINAR
Time: Thursday, April 16, 2026, 09:00 ~ 16:30
Venue: Room 107, Pi-Chen Building, NTU Chu-Pei Campus (No. 88, Zhuangjing 1st Rd., Zhubei City,
Hsinchu County)
Organizer: SGS Functional Safety and Cybersecurity Center
Co-organizer: NTU Radiation Application and Hardness Technology Research Center (NTU RTRC)
Contact: (02) 2299-3279 Ext. 3660~3662 / Email: tw.fs@sgs.com
Registration: Please scan the QR Code on the event poster to register online
